X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation.

J M Sasaki, L P Cardoso, C Campos, K J Roberts, G F Clark, E Pantos, M A Sacilotti

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	325-330
Number of pages	6
Journal	Journal of Applied Crystallography
Volume	29
Publication status	Published - 1996

Cite this

@article{bae64c016baa459e86f30a6a14c63449,

title = "X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation.",

author = "Sasaki, \{J M\} and Cardoso, \{L P\} and C Campos and Roberts, \{K J\} and Clark, \{G F\} and E Pantos and Sacilotti, \{M A\}",

year = "1996",

language = "English",

volume = "29",

pages = "325--330",

journal = "Journal of Applied Crystallography",

issn = "0021-8898",

publisher = "International Union of Crystallography",

}

TY - JOUR

T1 - X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation.

AU - Sasaki, J M

AU - Cardoso, L P

AU - Campos, C

AU - Roberts, K J

AU - Clark, G F

AU - Pantos, E

AU - Sacilotti, M A

PY - 1996

Y1 - 1996

M3 - Article

SN - 0021-8898

VL - 29

SP - 325

EP - 330

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

ER -