X-ray Multiple Diffraction in Renninger Scanning Mode: Simulation of Data Recorded using Synchrotron Radiation

INIS

• data 100%
• simulation 100%
• x-ray diffraction 100%
• synchrotron radiation 100%
• beams 75%
• crystals 50%
• length 50%
• polarization 50%
• applications 25%
• experimental data 25%
• surfaces 25%
• layers 25%
• matrices 25%
• semiconductor materials 25%
• single crystals 25%
• indium phosphides 25%
• secondary beams 25%

Engineering

• Pathlength 100%
• Simulation Mode 100%
• Diffracted Beam 100%
• Good Agreement 50%
• Bulk Material 50%
• Layer Structure 50%
• Dynamical Theory 50%
• Beam Radiation 50%
• Polarization Factor 50%

Physics

• X-Ray Multiple Diffraction 100%
• Synchrotron Radiation 100%
• Single Crystal 25%