X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation.

J M Sasaki, L P Cardoso, C Campos, K J Roberts, G F Clark, E Pantos, M A Sacilotti

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)325-330
Number of pages6
JournalJournal of Applied Crystallography
Publication statusPublished - 1996

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