X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation.

J M Sasaki, L P Cardoso, C Campos, K J Roberts, G F Clark, E Pantos, M A Sacilotti

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)325-330
Number of pages6
JournalJournal of Applied Crystallography
Volume29
Publication statusPublished - 1996

Cite this

Sasaki, J. M., Cardoso, L. P., Campos, C., Roberts, K. J., Clark, G. F., Pantos, E., & Sacilotti, M. A. (1996). X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation. Journal of Applied Crystallography, 29, 325-330.
Sasaki, J M ; Cardoso, L P ; Campos, C ; Roberts, K J ; Clark, G F ; Pantos, E ; Sacilotti, M A. / X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation. In: Journal of Applied Crystallography. 1996 ; Vol. 29. pp. 325-330.
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year = "1996",
language = "English",
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journal = "Journal of Applied Crystallography",
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Sasaki, JM, Cardoso, LP, Campos, C, Roberts, KJ, Clark, GF, Pantos, E & Sacilotti, MA 1996, 'X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation.', Journal of Applied Crystallography, vol. 29, pp. 325-330.

X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation. / Sasaki, J M; Cardoso, L P; Campos, C; Roberts, K J; Clark, G F; Pantos, E; Sacilotti, M A.

In: Journal of Applied Crystallography, Vol. 29, 1996, p. 325-330.

Research output: Contribution to journalArticle

TY - JOUR

T1 - X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation.

AU - Sasaki, J M

AU - Cardoso, L P

AU - Campos, C

AU - Roberts, K J

AU - Clark, G F

AU - Pantos, E

AU - Sacilotti, M A

PY - 1996

Y1 - 1996

M3 - Article

VL - 29

SP - 325

EP - 330

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

SN - 0021-8898

ER -