X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation.

J M Sasaki, L P Cardoso, C Campos, K J Roberts, G F Clark, E Pantos, M A Sacilotti

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)325-330
Number of pages6
JournalJournal of Applied Crystallography
Volume29
Publication statusPublished - 1996

Cite this

Sasaki, J. M., Cardoso, L. P., Campos, C., Roberts, K. J., Clark, G. F., Pantos, E., & Sacilotti, M. A. (1996). X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation. Journal of Applied Crystallography, 29, 325-330.