Original language | English |
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Pages (from-to) | 325-330 |
Number of pages | 6 |
Journal | Journal of Applied Crystallography |
Volume | 29 |
Publication status | Published - 1996 |
X-ray multiple diffraction in Renninger scanning mode : simulation of data using synchrotron radiation.
J M Sasaki, L P Cardoso, C Campos, K J Roberts, G F Clark, E Pantos, M A Sacilotti
Research output: Contribution to journal › Article