X-ray diffraction analysis of parchment: Applications to manufacture, conservation and restoration

Craig J Kennedy, Jennifer C Hiller, Clark A Maxwell, Timothy J Wess

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	International Council of Museums Committee for Conservation 14th Triennial Meeting, The Hague, 12-16 September 2005
Publisher	James & James
Pages	180-185
Number of pages	6
ISBN (Print)	9781844072538, 1844072533
Publication status	Published - 2005
Event	International Council of Museums Committee for Conservation 14th Triennial Meeting - The Hague, Netherlands Duration: 12 Sept 2005 → 16 Sept 2005

Conference	International Council of Museums Committee for Conservation 14th Triennial Meeting
Country/Territory	Netherlands
City	The Hague
Period	12/09/05 → 16/09/05

Cite this

@inproceedings{51ed5341cf19414aa929bdd45954bd9e,

title = "X-ray diffraction analysis of parchment: Applications to manufacture, conservation and restoration",

author = "Kennedy, {Craig J} and Hiller, {Jennifer C} and Maxwell, {Clark A} and Wess, {Timothy J}",

year = "2005",

language = "English",

isbn = "9781844072538",

pages = "180--185",

booktitle = "International Council of Museums Committee for Conservation 14th Triennial Meeting, The Hague, 12-16 September 2005",

publisher = "James & James",

note = "International Council of Museums Committee for Conservation 14th Triennial Meeting ; Conference date: 12-09-2005 Through 16-09-2005",

}

Kennedy, CJ, Hiller, JC, Maxwell, CA & Wess, TJ 2005, X-ray diffraction analysis of parchment: Applications to manufacture, conservation and restoration. in International Council of Museums Committee for Conservation 14th Triennial Meeting, The Hague, 12-16 September 2005. James & James, pp. 180-185, International Council of Museums Committee for Conservation 14th Triennial Meeting, The Hague, Netherlands, 12/09/05.

X-ray diffraction analysis of parchment: Applications to manufacture, conservation and restoration. / Kennedy, Craig J; Hiller, Jennifer C; Maxwell, Clark A et al.
International Council of Museums Committee for Conservation 14th Triennial Meeting, The Hague, 12-16 September 2005. James & James, 2005. p. 180-185.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - X-ray diffraction analysis of parchment: Applications to manufacture, conservation and restoration

AU - Kennedy, Craig J

AU - Hiller, Jennifer C

AU - Maxwell, Clark A

AU - Wess, Timothy J

PY - 2005

Y1 - 2005

M3 - Conference contribution

SN - 9781844072538

SN - 1844072533

SP - 180

EP - 185

BT - International Council of Museums Committee for Conservation 14th Triennial Meeting, The Hague, 12-16 September 2005

PB - James & James

T2 - International Council of Museums Committee for Conservation 14th Triennial Meeting

Y2 - 12 September 2005 through 16 September 2005

ER -