X-ray diffraction analysis of parchment: Applications to manufacture, conservation and restoration

Craig J Kennedy, Jennifer C Hiller, Clark A Maxwell, Timothy J Wess

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Original languageEnglish
    Title of host publicationInternational Council of Museums Committee for Conservation 14th Triennial Meeting, The Hague, 12-16 September 2005
    PublisherJames & James
    Pages180-185
    Number of pages6
    ISBN (Print)9781844072538, 1844072533
    Publication statusPublished - 2005
    EventInternational Council of Museums Committee for Conservation 14th Triennial Meeting - The Hague, Netherlands
    Duration: 12 Sep 200516 Sep 2005

    Conference

    ConferenceInternational Council of Museums Committee for Conservation 14th Triennial Meeting
    CountryNetherlands
    CityThe Hague
    Period12/09/0516/09/05

    Cite this

    Kennedy, C. J., Hiller, J. C., Maxwell, C. A., & Wess, T. J. (2005). X-ray diffraction analysis of parchment: Applications to manufacture, conservation and restoration. In International Council of Museums Committee for Conservation 14th Triennial Meeting, The Hague, 12-16 September 2005 (pp. 180-185). James & James.