Using synchrotron radiation x-ray multiple diffraction to examine the lattice coherency of semiconductor surfaces and epitaxial layers

J. M. Sasaki, L. P. Cardoso, C. Campos, K. J. Roberts, G. F. Clark, E. Pantos, M. A. Sacilotti

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

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