Abstract
The use of vibration excitation in the holographic detection of debonding flaws in film-substrate samples is described. The improvements to the technique produced by reference wave phase modulation are discussed and demonstrated.
| Original language | English |
|---|---|
| Pages (from-to) | 1403-1405 |
| Number of pages | 3 |
| Journal | Applied Optics |
| Volume | 29 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - Apr 1990 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering
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