Abstract
Thermal HNDT experiments are described that use two methods of fringe control to eliminate background fringe motion, resulting in improved identification of bonding flaws.
| Original language | English |
|---|---|
| Pages (from-to) | 1744-1745 |
| Number of pages | 2 |
| Journal | Applied Optics |
| Volume | 28 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 15 May 1989 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering