Use of automated image acquisition and stitching in scanning electron microscopy: Imaging of large scale areas of materials at high resolution: SEM image stitching

Jim Buckman

Use of automated image acquisition and stitching in scanning electron microscopy: Imaging of large scale areas of materials at high resolution: SEM image stitching

School of Energy, Geoscience, Infrastructure and Society

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	s13-16
Number of pages	3
Journal	Microscopy and Analysis
Volume	January 2014
Publication status	Published - Jan 2014

Access to Document

http://www.microscopy-analysis.com/magazine/issues/use-automated-image-acquisition-and-stitching-scanning-electron-microscopy-imaging

Cite this

@article{74ad1e86a74546c6acbab7294cdb00aa,

title = "Use of automated image acquisition and stitching in scanning electron microscopy: Imaging of large scale areas of materials at high resolution: SEM image stitching",

author = "Jim Buckman",

year = "2014",

month = jan,

language = "English",

volume = "January 2014",

pages = "s13--16",

journal = "Microscopy and Analysis",

issn = "0958-1952",

}

Buckman, J 2014, 'Use of automated image acquisition and stitching in scanning electron microscopy: Imaging of large scale areas of materials at high resolution: SEM image stitching', Microscopy and Analysis, vol. January 2014, pp. s13-16. <http://www.microscopy-analysis.com/magazine/issues/use-automated-image-acquisition-and-stitching-scanning-electron-microscopy-imaging>