Abstract
By inducing two-photon absorption within the device layer of a proprietary silicon test chip, the first nonlinear variant of X-variation mapping is reported by demonstrating frequency mapping of a ring oscillator circuit at 1.55µ. Copyright © 2010 ASM International® All rights reserved.
| Original language | English |
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| Title of host publication | ISTFA 2010 - Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis |
| Pages | 14-19 |
| Number of pages | 6 |
| Publication status | Published - 2010 |
| Event | 36th International Symposium for Testing and Failure Analysis - Dallas, TX, United States Duration: 14 Nov 2010 → 18 Nov 2010 |
Conference
| Conference | 36th International Symposium for Testing and Failure Analysis |
|---|---|
| Abbreviated title | ISTFA 2010 |
| Country/Territory | United States |
| City | Dallas, TX |
| Period | 14/11/10 → 18/11/10 |