Two-photon X-variation mapping based on a diode-pumped femtosecond laser

K. A. Serrels; D. T. Reid; T. R. Lundquist; P. Vedagarbha

Two-photon X-variation mapping based on a diode-pumped femtosecond laser

K. A. Serrels
, D. T. Reid
, T. R. Lundquist
, P. Vedagarbha

School of Engineering & Physical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

6 Citations (Scopus)

Abstract

By inducing two-photon absorption within the device layer of a proprietary silicon test chip, the first nonlinear variant of X-variation mapping is reported by demonstrating frequency mapping of a ring oscillator circuit at 1.55µ. Copyright © 2010 ASM International® All rights reserved.

Original language	English
Title of host publication	ISTFA 2010 - Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis
Pages	14-19
Number of pages	6
Publication status	Published - 2010
Event	36th International Symposium for Testing and Failure Analysis - Dallas, TX, United States Duration: 14 Nov 2010 → 18 Nov 2010

Conference

Conference	36th International Symposium for Testing and Failure Analysis
Abbreviated title	ISTFA 2010
Country/Territory	United States
City	Dallas, TX
Period	14/11/10 → 18/11/10

Cite this

@inproceedings{e77d98cba90a40c8be9bc943eed2c712,

title = "Two-photon X-variation mapping based on a diode-pumped femtosecond laser",

abstract = "By inducing two-photon absorption within the device layer of a proprietary silicon test chip, the first nonlinear variant of X-variation mapping is reported by demonstrating frequency mapping of a ring oscillator circuit at 1.55µ. Copyright {\textcopyright} 2010 ASM International{\textregistered} All rights reserved.",

author = "Serrels, \{K. A.\} and Reid, \{D. T.\} and Lundquist, \{T. R.\} and P. Vedagarbha",

year = "2010",

language = "English",

isbn = "9781615030415",

pages = "14--19",

booktitle = "ISTFA 2010 - Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis",

note = "36th International Symposium for Testing and Failure Analysis, ISTFA 2010 ; Conference date: 14-11-2010 Through 18-11-2010",

}

TY - GEN

T1 - Two-photon X-variation mapping based on a diode-pumped femtosecond laser

AU - Serrels, K. A.

AU - Reid, D. T.

AU - Lundquist, T. R.

AU - Vedagarbha, P.

PY - 2010

Y1 - 2010

N2 - By inducing two-photon absorption within the device layer of a proprietary silicon test chip, the first nonlinear variant of X-variation mapping is reported by demonstrating frequency mapping of a ring oscillator circuit at 1.55µ. Copyright © 2010 ASM International® All rights reserved.

AB - By inducing two-photon absorption within the device layer of a proprietary silicon test chip, the first nonlinear variant of X-variation mapping is reported by demonstrating frequency mapping of a ring oscillator circuit at 1.55µ. Copyright © 2010 ASM International® All rights reserved.

UR - https://www.scopus.com/pages/publications/79952344787

M3 - Conference contribution

SN - 9781615030415

SP - 14

EP - 19

BT - ISTFA 2010 - Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis

T2 - 36th International Symposium for Testing and Failure Analysis

Y2 - 14 November 2010 through 18 November 2010

ER -

Two-photon X-variation mapping based on a diode-pumped femtosecond laser

Abstract

Conference

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