Two-photon X-variation mapping based on a diode-pumped femtosecond laser

K. A. Serrels, D. T. Reid, T. R. Lundquist, P. Vedagarbha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

By inducing two-photon absorption within the device layer of a proprietary silicon test chip, the first nonlinear variant of X-variation mapping is reported by demonstrating frequency mapping of a ring oscillator circuit at 1.55µ. Copyright © 2010 ASM International® All rights reserved.

Original languageEnglish
Title of host publicationISTFA 2010 - Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis
Pages14-19
Number of pages6
Publication statusPublished - 2010
Event36th International Symposium for Testing and Failure Analysis - Dallas, TX, United States
Duration: 14 Nov 201018 Nov 2010

Conference

Conference36th International Symposium for Testing and Failure Analysis
Abbreviated titleISTFA 2010
CountryUnited States
CityDallas, TX
Period14/11/1018/11/10

Fingerprint Dive into the research topics of 'Two-photon X-variation mapping based on a diode-pumped femtosecond laser'. Together they form a unique fingerprint.

Cite this