Two CMOS BGR using CM and DTMOST techniques

Faisal Mohd-Yasin, Ying Khai Teh, Florence Chiao Mei Choong, Mamun Bin Ibne Reaz

Research output: Book/ReportCommissioned report

Abstract

Two CMOS BGR using current mode (0.044mm2) and Dynamic Threshold MOST (0.017mm2) techniques are designed on CMOS 0.18μm process. On-wafer measurement shows both circuits have minimum operating VDD 1.28V at 25oC; taking 2.1μA and 0.5μA (maximum current 3.1μA and 1.1μA) and output voltage of 514mV and 457mV. Both circuits could support VDD range up to 4V required by passive UHF RFID.
Original languageEnglish
PublisherAbdus Salam International Centre for Theoretical Physics
Number of pages9
Volume042
Publication statusPublished - Jun 2009

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