Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping

Bernardino Barrientos García; Andrew J. Moore; Carlos Pérez-López; Lingli Wang; Theo Tshudi

Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping

Bernardino Barrientos García, Andrew J. Moore, Carlos Pérez-López, Lingli Wang, Theo Tshudi

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article › peer-review

47 Citations (Scopus)

Abstract

We have used a computer-generated holographic optical element (HOE) with electronic speckle pattern interferometry to calculate the interference phase corresponding to the deformation of a test object from a single TV frame. The HOE is a modified crossed phase grating that introduces a known phase change between the ± 1 diffracted orders, without being translated. The progressive propagation of transient mechanical waves was measured with an rms precision of 2p/30. ©1999 Optical Society of America.

Original language	English
Pages (from-to)	5944-5947
Number of pages	4
Journal	Applied Optics
Volume	38
Issue number	28
Publication status	Published - 1 Oct 1999

Cite this

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title = "Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping",

abstract = "We have used a computer-generated holographic optical element (HOE) with electronic speckle pattern interferometry to calculate the interference phase corresponding to the deformation of a test object from a single TV frame. The HOE is a modified crossed phase grating that introduces a known phase change between the ± 1 diffracted orders, without being translated. The progressive propagation of transient mechanical waves was measured with an rms precision of 2p/30. {\textcopyright}1999 Optical Society of America.",

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T1 - Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping

AU - García, Bernardino Barrientos

AU - Moore, Andrew J.

AU - Pérez-López, Carlos

AU - Wang, Lingli

AU - Tshudi, Theo

PY - 1999/10/1

Y1 - 1999/10/1

N2 - We have used a computer-generated holographic optical element (HOE) with electronic speckle pattern interferometry to calculate the interference phase corresponding to the deformation of a test object from a single TV frame. The HOE is a modified crossed phase grating that introduces a known phase change between the ± 1 diffracted orders, without being translated. The progressive propagation of transient mechanical waves was measured with an rms precision of 2p/30. ©1999 Optical Society of America.

AB - We have used a computer-generated holographic optical element (HOE) with electronic speckle pattern interferometry to calculate the interference phase corresponding to the deformation of a test object from a single TV frame. The HOE is a modified crossed phase grating that introduces a known phase change between the ± 1 diffracted orders, without being translated. The progressive propagation of transient mechanical waves was measured with an rms precision of 2p/30. ©1999 Optical Society of America.

UR - https://www.scopus.com/pages/publications/0009546751

M3 - Article

SN - 1559-128X

VL - 38

SP - 5944

EP - 5947

JO - Applied Optics

JF - Applied Optics

IS - 28

ER -

Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping

Abstract

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