Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping

Bernardino Barrientos García, Andrew J. Moore, Carlos Pérez-López, Lingli Wang, Theo Tshudi

Research output: Contribution to journalArticle

44 Citations (Scopus)

Abstract

We have used a computer-generated holographic optical element (HOE) with electronic speckle pattern interferometry to calculate the interference phase corresponding to the deformation of a test object from a single TV frame. The HOE is a modified crossed phase grating that introduces a known phase change between the ± 1 diffracted orders, without being translated. The progressive propagation of transient mechanical waves was measured with an rms precision of 2p/30. ©1999 Optical Society of America.

Original languageEnglish
Pages (from-to)5944-5947
Number of pages4
JournalApplied Optics
Volume38
Issue number28
Publication statusPublished - 1 Oct 1999

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