Transient deformation measurement with elctronic speckle pattern interferometry by use of a holographic optical element for spatial phase-stepping

B Barrientos Garcia; Andrew John Moore; C Perez-Lopez; L Wang; T Tschudi

Transient deformation measurement with elctronic speckle pattern interferometry by use of a holographic optical element for spatial phase-stepping

B Barrientos Garcia, Andrew John Moore, C Perez-Lopez, L Wang, T Tschudi

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	5944-5947
Number of pages	4
Journal	Applied Optics
Volume	38
Issue number	28
Publication status	Published - 1999

Cite this

@article{16f23c5762a445728580ec00c3894d22,

title = "Transient deformation measurement with elctronic speckle pattern interferometry by use of a holographic optical element for spatial phase-stepping",

author = "Garcia, \{B Barrientos\} and Moore, \{Andrew John\} and C Perez-Lopez and L Wang and T Tschudi",

year = "1999",

language = "English",

volume = "38",

pages = "5944--5947",

journal = "Applied Optics",

issn = "1559-128X",

publisher = "Optica Publishing Group",

number = "28",

}

TY - JOUR

T1 - Transient deformation measurement with elctronic speckle pattern interferometry by use of a holographic optical element for spatial phase-stepping

AU - Garcia, B Barrientos

AU - Moore, Andrew John

AU - Perez-Lopez, C

AU - Wang, L

AU - Tschudi, T

PY - 1999

Y1 - 1999

M3 - Article

SN - 1559-128X

VL - 38

SP - 5944

EP - 5947

JO - Applied Optics

JF - Applied Optics

IS - 28

ER -