Transient deformation measurement with elctronic speckle pattern interferometry by use of a holographic optical element for spatial phase-stepping

B Barrientos Garcia, Andrew John Moore, C Perez-Lopez, L Wang, T Tschudi

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)5944-5947
Number of pages4
JournalApplied Optics
Volume38
Issue number28
Publication statusPublished - 1999

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