Original language | English |
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Pages (from-to) | 5944-5947 |
Number of pages | 4 |
Journal | Applied Optics |
Volume | 38 |
Issue number | 28 |
Publication status | Published - 1999 |
Transient deformation measurement with elctronic speckle pattern interferometry by use of a holographic optical element for spatial phase-stepping
B Barrientos Garcia, Andrew John Moore, C Perez-Lopez, L Wang, T Tschudi
Research output: Contribution to journal › Article › peer-review