@inproceedings{4030d9a57a084a1098ef35a29c2da799,
title = "Towards Freeform Reflective Fused Silica Optics using Ultrafast Laser-Assisted Etching",
abstract = "While conventional methods like diamond turning can achieve the necessary precision for manufacturing image slicers, they are often expensive in cost and time, and restrictive in terms of the materials to which they can be readily applied. Ultrafast laser-assisted etching (ULAE) is an emerging manufacturing technology that could potentially be used to manufacture free form reflective optics using fused silica, as it enables µm-level precision shaping of fused silica over several millimetres scales. Here we demonstrate the potential of ULAE for manufacturing fused silica image slicers by fabricating precision 8 × 1 mm flat fused silica surfaces using ULAE. The waviness meets the required level for this application, staying below 1 µm. Specifically, we measured S10z = 0.164 µm. The roughness varies with surface inclination; for a flat surface at 0◦ inclination, we measured Sq = 109 nm, while at a 5◦ inclination, it increased to Sq = 204 nm. If combined with a suitable polishing technique to remove the high spatial frequency roughness, we believe this work demonstrates that ULAE provides a new route to manufacture freeform reflective monolithic fused silica optics such as image slicers for ground- and space-based applications.",
keywords = "chemical-etching, image-slicer, Optical manufacturing, ultrafast-laser",
author = "{Van Gorp}, Thibaud and Aur{\'e}lien Beno{\^i}t and Ross, {Calum A.} and Pablo Rold{\'a}n-Varona and Chris Evans and David Lee and Hand, {Duncan P.} and Thomson, {Robert R.}",
note = "Publisher Copyright: {\textcopyright} 2024 SPIE.; SPIE Astronomical Telescopes + Instrumentation 2024 ; Conference date: 16-06-2024 Through 21-06-2024",
year = "2024",
month = aug,
day = "26",
doi = "10.1117/12.3022721",
language = "English",
isbn = "9781510675230",
series = "Proceedings of SPIE",
publisher = "SPIE",
editor = "Ramon Navarro and Ralf Jedamzik",
booktitle = "Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation VI",
address = "United States",
}