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Topography measurements of the critical thickness of ZnSe grown on GaAs
Gordon Horsburgh, Kevin Alan Prior, Wyn Meredith, Ian Galbraith, Brian Clifford Cavenett, C. R. Whitehouse, G. Lacey, Anthony G. Cullis, P. J. Parbrook, P. Möck, K. Mizuno
Research output: Contribution to journal › Article › peer-review
14
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(Scopus)