Topography measurements of the critical thickness of ZnSe grown on GaAs

Gordon Horsburgh, Kevin Alan Prior, Wyn Meredith, Ian Galbraith, Brian Clifford Cavenett, C. R. Whitehouse, G. Lacey, Anthony G. Cullis, P. J. Parbrook, P. Möck, K. Mizuno

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

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Physics & Astronomy