Tolerance analysis of cascaded self-electro-optic-effect-device arrays

Marc P Y Desmulliez, Brian S. Werrett, John F. Snowdon

Research output: Contribution to journalArticle

Abstract

A model is reported for the symmetric self-electro-optic-effect devices (S-SEED), and the tolerance analysis within cascaded range for such devices is presented. The model is realistic enough to show good agreement with existing experimental data for tolerance analysis without great computational demands. The S-SEED model has also been used to obtain range of control parameters to achieve operation at a required cycle rate.

Original languageEnglish
Pages (from-to)1368-1375
Number of pages8
JournalApplied Optics
Volume33
Issue number8
Publication statusPublished - 1 Jan 1994

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