Time-of-flight depth imaging at 1550 nm wavelength at kilometer-range distances using an InGaAs/InP single-photon avalanche diode detector

Ximing Ren*, Aongus McCarthy, Adriano Della Frera, Nathan R. Gemmell, Nils J. Krichel, Carmelo Scarcella, Alessandro Ruggeri, Alberto Tosi, Gerald S. Buller

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Physics