The use of X-ray scattering to analyse parchment structure and degradation

Craig J Kennedy, Timothy J Wess

    Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

    14 Citations (Scopus)
    Original languageEnglish
    Title of host publicationPhysical Techniques in the Study of Art, Archaeology and Cultural Heritage
    EditorsDudley Creagh, David Bradley
    PublisherElsevier
    Pages151-172
    Number of pages22
    Edition1
    ISBN (Electronic)9780080461861
    ISBN (Print)9780444521316
    Publication statusPublished - 2006

    Cite this

    Kennedy, C. J., & Wess, T. J. (2006). The use of X-ray scattering to analyse parchment structure and degradation. In D. Creagh, & D. Bradley (Eds.), Physical Techniques in the Study of Art, Archaeology and Cultural Heritage (1 ed., pp. 151-172). Elsevier. http://store.elsevier.com/Physical-Techniques-in-the-Study-of-Art-Archaeology-and-Cultural-Heritage/isbn-9780444521316/