The surface morphology and characterisation of electronic properties of boron implanted microwave plasma CVD diamond films by atomic force and scanning tunneling microscopies

A G Fitzgerald; Y Fan; P John; C E Troupe; John Ivor Barrett Wilson

The surface morphology and characterisation of electronic properties of boron implanted microwave plasma CVD diamond films by atomic force and scanning tunneling microscopies

A G Fitzgerald, Y Fan, P John, C E Troupe, John Ivor Barrett Wilson

School of Engineering & Physical Sciences

Research output: Contribution to conference › Paper › peer-review

Original language	English
Pages	332
Number of pages	1
Publication status	Published - 1998
Event	Proc. Microscopy & Microanalysis - Atlanta, United Kingdom Duration: 1 Jul 1998 → …

Conference

Conference	Proc. Microscopy & Microanalysis
Country/Territory	United Kingdom
City	Atlanta
Period	1/07/98 → …
Other	eds. G W Bailey et al

Cite this

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title = "The surface morphology and characterisation of electronic properties of boron implanted microwave plasma CVD diamond films by atomic force and scanning tunneling microscopies",

author = "Fitzgerald, \{A G\} and Y Fan and P John and Troupe, \{C E\} and Wilson, \{John Ivor Barrett\}",

year = "1998",

language = "English",

pages = "332",

note = "Proc. Microscopy \& Microanalysis ; Conference date: 01-07-1998",

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The surface morphology and characterisation of electronic properties of boron implanted microwave plasma CVD diamond films by atomic force and scanning tunneling microscopies. / Fitzgerald, A G; Fan, Y; John, P et al.
1998. 332 Paper presented at Proc. Microscopy & Microanalysis, Atlanta, United Kingdom.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - The surface morphology and characterisation of electronic properties of boron implanted microwave plasma CVD diamond films by atomic force and scanning tunneling microscopies

AU - Fitzgerald, A G

AU - Fan, Y

AU - John, P

AU - Troupe, C E

AU - Wilson, John Ivor Barrett

PY - 1998

Y1 - 1998

M3 - Paper

SP - 332

T2 - Proc. Microscopy & Microanalysis

Y2 - 1 July 1998

ER -