The Reliability of an Electroactive Material in Harsh Operating Environments

D.Y. Zheng, Jonathan Swingler, Paul Weaver

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInstitute of Physics Dielectrics Conference 2009
Publication statusPublished - 16 Apr 2009

Cite this

Zheng, D. Y., Swingler, J., & Weaver, P. (2009). The Reliability of an Electroactive Material in Harsh Operating Environments. In Institute of Physics Dielectrics Conference 2009