The Effects of Skewed Distributions on the Performance of Variable Sample Size X Chart

Wei Lin Teoh, Michael Boon Chong Khoo, Zhi Lin Chong, Sin Yin Teh

Research output: Contribution to journalArticle

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Original languageEnglish
Pages (from-to)171-176
Number of pages6
JournalInternational Journal of Electrical and Electronic Engineering and Telecommunications
Volume8
Issue number3
DOIs
Publication statusPublished - May 2019

Keywords

  • Average run length
  • Skewed distribution
  • Standard deviation of the run length
  • Statistical process control
  • Variable sample size X chart

ASJC Scopus subject areas

  • Instrumentation
  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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