Test structures for characterising the integration of EWOD and SAW technologies for microfluidics

Y. Li; Y. Q. Fu; B. W. Flynn; W. Parkes; Y. Liu; S. Brodie; J. G. Terry; L. I. Haworth; A. S. Bunting; J. T M Stevenson; S Smith; A. J. Walton

doi:10.1109/ICMTS.2010.5466861

Test structures for characterising the integration of EWOD and SAW technologies for microfluidics

Y. Li, Y. Q. Fu, B. W. Flynn, W. Parkes, Y. Liu, S. Brodie, J. G. Terry, L. I. Haworth, A. S. Bunting, J. T M Stevenson, S Smith, A. J. Walton

School of Engineering & Physical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Citations (Scopus)

Abstract

This paper presents details of the design and fabrication of test structures specifically designed for the characterisation of two distinct digital microfluidic technologies: Electro-Wetting On Dielectric (EWOD) and Surface Acoustic Wave (SAW). A test chip has been fabricated that includes structures with a wide range of dimensions and provides the capability to characterise enhanced droplet manipulation as well as other integrated functions. In particular, we detail the use of EWOD to anchor droplets while SAW excitation is applied to perform mixing. ©2010 IEEE.

Original language	English
Title of host publication	2010 International Conference on Microelectronic Test Structures, 23rd IEEE ICMTS Conference Proceedings
Pages	52-57
Number of pages	6
DOIs	https://doi.org/10.1109/ICMTS.2010.5466861
Publication status	Published - 2010
Event	2010 International Conference on Microelectronic Test Structures - Hiroshima, Japan Duration: 22 Mar 2010 → 25 Mar 2010

Conference

Conference	2010 International Conference on Microelectronic Test Structures
Abbreviated title	ICMTS 2010
Country/Territory	Japan
City	Hiroshima
Period	22/03/10 → 25/03/10

Keywords

ElectroWetting On Dielectric (EWOD)
Manipulation
Microfluidics
Mixing
Surface Acoustic Wave (SAW)
Test structures
Transportation

Access to Document

10.1109/ICMTS.2010.5466861

Cite this

Li, Y., Fu, Y. Q., Flynn, B. W., Parkes, W., Liu, Y., Brodie, S., Terry, J. G., Haworth, L. I., Bunting, A. S., Stevenson, J. T. M., Smith, S., & Walton, A. J. (2010). Test structures for characterising the integration of EWOD and SAW technologies for microfluidics. In 2010 International Conference on Microelectronic Test Structures, 23rd IEEE ICMTS Conference Proceedings (pp. 52-57) https://doi.org/10.1109/ICMTS.2010.5466861

@inproceedings{05266ba78e8b45e686bf0b5cc5858d0b,

title = "Test structures for characterising the integration of EWOD and SAW technologies for microfluidics",

abstract = "This paper presents details of the design and fabrication of test structures specifically designed for the characterisation of two distinct digital microfluidic technologies: Electro-Wetting On Dielectric (EWOD) and Surface Acoustic Wave (SAW). A test chip has been fabricated that includes structures with a wide range of dimensions and provides the capability to characterise enhanced droplet manipulation as well as other integrated functions. In particular, we detail the use of EWOD to anchor droplets while SAW excitation is applied to perform mixing. {\textcopyright}2010 IEEE.",

keywords = "ElectroWetting On Dielectric (EWOD), Manipulation, Microfluidics, Mixing, Surface Acoustic Wave (SAW), Test structures, Transportation",

author = "Y. Li and Fu, {Y. Q.} and Flynn, {B. W.} and W. Parkes and Y. Liu and S. Brodie and Terry, {J. G.} and Haworth, {L. I.} and Bunting, {A. S.} and Stevenson, {J. T M} and S Smith and Walton, {A. J.}",

year = "2010",

doi = "10.1109/ICMTS.2010.5466861",

language = "English",

isbn = "9781424469154",

pages = "52--57",

booktitle = "2010 International Conference on Microelectronic Test Structures, 23rd IEEE ICMTS Conference Proceedings",

note = "2010 International Conference on Microelectronic Test Structures, ICMTS 2010 ; Conference date: 22-03-2010 Through 25-03-2010",

}

Li, Y, Fu, YQ, Flynn, BW, Parkes, W, Liu, Y, Brodie, S, Terry, JG, Haworth, LI, Bunting, AS, Stevenson, JTM, Smith, S & Walton, AJ 2010, Test structures for characterising the integration of EWOD and SAW technologies for microfluidics. in 2010 International Conference on Microelectronic Test Structures, 23rd IEEE ICMTS Conference Proceedings. pp. 52-57, 2010 International Conference on Microelectronic Test Structures, Hiroshima, Japan, 22/03/10. https://doi.org/10.1109/ICMTS.2010.5466861

TY - GEN

T1 - Test structures for characterising the integration of EWOD and SAW technologies for microfluidics

AU - Li, Y.

AU - Fu, Y. Q.

AU - Flynn, B. W.

AU - Parkes, W.

AU - Liu, Y.

AU - Brodie, S.

AU - Terry, J. G.

AU - Haworth, L. I.

AU - Bunting, A. S.

AU - Stevenson, J. T M

AU - Smith, S

AU - Walton, A. J.

PY - 2010

Y1 - 2010

N2 - This paper presents details of the design and fabrication of test structures specifically designed for the characterisation of two distinct digital microfluidic technologies: Electro-Wetting On Dielectric (EWOD) and Surface Acoustic Wave (SAW). A test chip has been fabricated that includes structures with a wide range of dimensions and provides the capability to characterise enhanced droplet manipulation as well as other integrated functions. In particular, we detail the use of EWOD to anchor droplets while SAW excitation is applied to perform mixing. ©2010 IEEE.

AB - This paper presents details of the design and fabrication of test structures specifically designed for the characterisation of two distinct digital microfluidic technologies: Electro-Wetting On Dielectric (EWOD) and Surface Acoustic Wave (SAW). A test chip has been fabricated that includes structures with a wide range of dimensions and provides the capability to characterise enhanced droplet manipulation as well as other integrated functions. In particular, we detail the use of EWOD to anchor droplets while SAW excitation is applied to perform mixing. ©2010 IEEE.

KW - ElectroWetting On Dielectric (EWOD)

KW - Manipulation

KW - Microfluidics

KW - Mixing

KW - Surface Acoustic Wave (SAW)

KW - Test structures

KW - Transportation

UR - http://www.scopus.com/inward/record.url?scp=77953908227&partnerID=8YFLogxK

U2 - 10.1109/ICMTS.2010.5466861

DO - 10.1109/ICMTS.2010.5466861

M3 - Conference contribution

SN - 9781424469154

SP - 52

EP - 57

BT - 2010 International Conference on Microelectronic Test Structures, 23rd IEEE ICMTS Conference Proceedings

T2 - 2010 International Conference on Microelectronic Test Structures

Y2 - 22 March 2010 through 25 March 2010

ER -

Test structures for characterising the integration of EWOD and SAW technologies for microfluidics

Abstract

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this