Terahertz characterization via an all-optical, ultra-thin-knife-edge technique

S. P. Ho, M. Shalaby, M. Peccianti, M. Clerici, A. Pasquazi, Y. Ozturk, J. Ali, R. Morandotti

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An all-optical, terahertz characterization based on a ultra-thin-knife-edge is demonstrated employing an ultraviolet-pulse to project the image of a blade on a ZnTe crystal, where the free carriers excited on a blade-shaped area act as a field-shield.

Original languageEnglish
Title of host publicationCLEO: QELS_Fundamental Science, CLEO:QELS FS 2013
Publication statusPublished - 2013
EventCLEO: QELS Fundamental Science 2013 - San Jose, CA, United States
Duration: 9 Jun 201314 Jun 2013

Conference

ConferenceCLEO: QELS Fundamental Science 2013
Abbreviated titleCLEO:QELS-FS 2013
CountryUnited States
CitySan Jose, CA
Period9/06/1314/06/13

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

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    Ho, S. P., Shalaby, M., Peccianti, M., Clerici, M., Pasquazi, A., Ozturk, Y., Ali, J., & Morandotti, R. (2013). Terahertz characterization via an all-optical, ultra-thin-knife-edge technique. In CLEO: QELS_Fundamental Science, CLEO:QELS FS 2013