Structural characterisation of condensed molecular materials using polarised NEXAFS spectroscopy

Joy Johnstone, Kevin J. Roberts

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The basic principals underpinning the technique of polarised Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy using synchrotron radiation are described with particular relevance to the technique's application in the structural characterisation of organic surfaces and interfaces. Experimental data, recorded in the ultra-soft spectral region close to the C and N K-edges (ca. 200eV to 500eV) on beamline U1A at the Brookhaven National Synchrotron Light Source (NSLS) is presented including applications to thin films of long chain hydrocarbons, LB films, anti-corrosion coatings and organic single crystals. © 1998 OPA (Overseas Publishers Association) Amsterdam B.V. Published under license under the Gordon and Breach Science Publishers imprint.

Original languageEnglish
Pages (from-to)39-53
Number of pages15
JournalMolecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals
Volume313
Publication statusPublished - 1998

Keywords

  • Molecular surfaces and interfaces
  • Polarised NEXAFS spectroscopy
  • Soft X-rays from synchrotron radiation
  • Structural characterisation

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