Abstract
The basic principals underpinning the technique of polarised Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy using synchrotron radiation are described with particular relevance to the technique's application in the structural characterisation of organic surfaces and interfaces. Experimental data, recorded in the ultra-soft spectral region close to the C and N K-edges (ca. 200eV to 500eV) on beamline U1A at the Brookhaven National Synchrotron Light Source (NSLS) is presented including applications to thin films of long chain hydrocarbons, LB films, anti-corrosion coatings and organic single crystals. © 1998 OPA (Overseas Publishers Association) Amsterdam B.V. Published under license under the Gordon and Breach Science Publishers imprint.
| Original language | English |
|---|---|
| Pages (from-to) | 39-53 |
| Number of pages | 15 |
| Journal | Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals |
| Volume | 313 |
| Publication status | Published - 1998 |
Keywords
- Molecular surfaces and interfaces
- Polarised NEXAFS spectroscopy
- Soft X-rays from synchrotron radiation
- Structural characterisation