Stress measurements in YTZP ceramic using GHz and THz radiation

Gilles Diederich*, Peter J Schemmel, Andrew J Moore

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have measured stress distributions in ceramic thermal barrier coatings using reflection-based polariscopes working at GHz and THz frequencies. Such coatings are routinely used in aerospace, automotive and energy applications. Understanding stress distributions within these coatings during manufacture and after use is vital to improving their performance. Stress optic coefficient measurements of bulk YTZP ceramic in reflection are compared to previously measured values in transmission. We then report in-situ calibration of the stress optic coefficient of YTZP coatings on metal substrates in reflection. Finally, we imaged the stress concentration around sub-surface defects in thermal barrier coated samples. We do not use time domain spectroscopy, representing a departure from more traditional THz imaging and metrology approaches.

Original languageEnglish
Title of host publication41st International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz)
PublisherIEEE
ISBN (Electronic)9781467384858
DOIs
Publication statusPublished - 1 Dec 2016
Event41st International Conference on Infrared, Millimeter and Terahertz Waves 2016 - Copenhagen, Denmark
Duration: 25 Sept 201630 Sept 2016

Publication series

NameInternational Conference on Infrared, Millimeter, and Terahertz Waves
PublisherIEEE
ISSN (Print)2162-2035

Conference

Conference41st International Conference on Infrared, Millimeter and Terahertz Waves 2016
Abbreviated titleIRMMW-THz 2016
Country/TerritoryDenmark
CityCopenhagen
Period25/09/1630/09/16

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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