Status and applications of microelectrical resistance tomography

Henri S. Tapp, R. A. Williams

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Electrical resistance tomography (ERT) is part of a suite of real-time low-cost two-dimensional imaging techniques which exploit the differences in the electrical properties of, for example, several flowing particulate systems. A physical sensor typically comprises an annular array of 16 electrodes mounted on a pipe wall such that the electrodes make electrical contact with the measured medium. Although the image fidelity is currently poor compared to X-ray tomography, the sensors can be scaled to suit the application. A microelectric resistance sensory system (MERT) is being developed for on-line interrogating down to 20-1000 micron length scales. This paper reviews the development of microelectrical sensing systems and reconstruction and interpretation methods using as example, a feasibility study on a 56 mm diameter bore sensor. This illustrates the limitations in the widely employed procedure of employing generic tomographic sensors and image feature extraction methods to extract application specific control parameters.

Original languageEnglish
Title of host publication1st World Congress on Industrial Process Tomography
PublisherInternational Society for Industrial Process Tomography
Pages552-559
Number of pages8
ISBN (Electronic)9780853163176
Publication statusPublished - 1999
Event1st World Congress in Industrial Process Tomography 1999 - Buxton, United Kingdom
Duration: 14 Apr 199917 Apr 1999

Conference

Conference1st World Congress in Industrial Process Tomography 1999
CountryUnited Kingdom
CityBuxton
Period14/04/9917/04/99

Keywords

  • Characterisation
  • Emulsions and pastes
  • Micro electrical resistance tomography
  • Particle and colloid suspensions

ASJC Scopus subject areas

  • Computational Mechanics
  • Control and Systems Engineering
  • Computer Science Applications
  • Computer Vision and Pattern Recognition

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    Tapp, H. S., & Williams, R. A. (1999). Status and applications of microelectrical resistance tomography. In 1st World Congress on Industrial Process Tomography (pp. 552-559). International Society for Industrial Process Tomography. http://www.isipt.org/world-congress/1/86.html