Statistical Machine Learning Analysis of Cyber Risk Data: Event Case Studies

Gareth Peters, Pavel V. Shevchenko, Ruben D. Cohen, Diane Maurice

Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)peer-review

Original languageEnglish
Title of host publicationFintech: Growth and Deregulation
EditorsDiane Maurice, Jack Freund , David Fairman
PublisherRisk Books
ISBN (Electronic)978-1-78272-398-1
ISBN (Print)9781782723875
Publication statusPublished - 19 Feb 2018

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