Solid-immersion-lens-enhanced nonlinear frequency-variation mapping of a silicon integrated-circuit

Keith A Serrels; Carl Farrell; Theodore R Lundquist; D. T. Reid; Praveen Vedagarbha

Solid-immersion-lens-enhanced nonlinear frequency-variation mapping of a silicon integrated-circuit

Keith A Serrels, Carl Farrell, Theodore R Lundquist, D. T. Reid, Praveen Vedagarbha

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

By inducing two-photon absorption within the active layer of a proprietary silicon test chip, we demonstrate solid-immersion-lens-enhanced nonlinear frequency-variation mapping of a 500-MHz ring oscillator circuit.

Original language	English
Title of host publication	2012 Conference on Lasers and Electro-Optics
Publisher	IEEE
Number of pages	2
ISBN (Print)	978-1-4673-1839-6
Publication status	Published - 2012
Event	2012 Conference on Lasers and Electro-Optics - San Jose, United States Duration: 6 May 2012 → 11 May 2012

Conference

Conference	2012 Conference on Lasers and Electro-Optics
Abbreviated title	CLEO 2012
Country/Territory	United States
City	San Jose
Period	6/05/12 → 11/05/12

Cite this

@inproceedings{6faeebad7fac410a8c7d31e6b47fb1d9,

title = "Solid-immersion-lens-enhanced nonlinear frequency-variation mapping of a silicon integrated-circuit",

abstract = "By inducing two-photon absorption within the active layer of a proprietary silicon test chip, we demonstrate solid-immersion-lens-enhanced nonlinear frequency-variation mapping of a 500-MHz ring oscillator circuit.",

author = "Serrels, {Keith A} and Carl Farrell and Lundquist, {Theodore R} and Reid, {D. T.} and Praveen Vedagarbha",

note = "INSPEC Accession Number: 13063687; 2012 Conference on Lasers and Electro-Optics, CLEO 2012 ; Conference date: 06-05-2012 Through 11-05-2012",

year = "2012",

language = "English",

isbn = "978-1-4673-1839-6",

booktitle = "2012 Conference on Lasers and Electro-Optics",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - Solid-immersion-lens-enhanced nonlinear frequency-variation mapping of a silicon integrated-circuit

AU - Serrels, Keith A

AU - Farrell, Carl

AU - Lundquist, Theodore R

AU - Reid, D. T.

AU - Vedagarbha, Praveen

N1 - INSPEC Accession Number: 13063687

PY - 2012

Y1 - 2012

N2 - By inducing two-photon absorption within the active layer of a proprietary silicon test chip, we demonstrate solid-immersion-lens-enhanced nonlinear frequency-variation mapping of a 500-MHz ring oscillator circuit.

AB - By inducing two-photon absorption within the active layer of a proprietary silicon test chip, we demonstrate solid-immersion-lens-enhanced nonlinear frequency-variation mapping of a 500-MHz ring oscillator circuit.

M3 - Conference contribution

SN - 978-1-4673-1839-6

BT - 2012 Conference on Lasers and Electro-Optics

PB - IEEE

T2 - 2012 Conference on Lasers and Electro-Optics

Y2 - 6 May 2012 through 11 May 2012

ER -

Solid-immersion-lens-enhanced nonlinear frequency-variation mapping of a silicon integrated-circuit

Abstract

Conference

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