Solid-immersion-lens-enhanced nonlinear frequency-variation mapping of a silicon integrated-circuit

Keith A Serrels, Carl Farrell, Theodore R Lundquist, D. T. Reid, Praveen Vedagarbha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

By inducing two-photon absorption within the active layer of a proprietary silicon test chip, we demonstrate solid-immersion-lens-enhanced nonlinear frequency-variation mapping of a 500-MHz ring oscillator circuit.

Original languageEnglish
Title of host publication2012 Conference on Lasers and Electro-Optics
PublisherIEEE
Number of pages2
ISBN (Print)978-1-4673-1839-6
Publication statusPublished - 2012
Event2012 Conference on Lasers and Electro-Optics - San Jose, United States
Duration: 6 May 201211 May 2012

Conference

Conference2012 Conference on Lasers and Electro-Optics
Abbreviated titleCLEO 2012
CountryUnited States
CitySan Jose
Period6/05/1211/05/12

Cite this

Serrels, K. A., Farrell, C., Lundquist, T. R., Reid, D. T., & Vedagarbha, P. (2012). Solid-immersion-lens-enhanced nonlinear frequency-variation mapping of a silicon integrated-circuit. In 2012 Conference on Lasers and Electro-Optics IEEE.