SMART precision interferometry at 794 nm

J.~D. Monnier, J.-P. Berger, R. Millan-Gabet, W.~A. Traub, N.~P. Carleton, E. Pedretti, C.~M. Coldwell, C.~D. Papaliolios

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

Single-mode fibers have been used in the near-infrared to dramatically reduce calibration error for long-baseline interferometry. We have begun an effort to apply the advantages of spatial filtering at visible wavelengths for precision measurements of pulsating Cepheids using the IOTA interferometer. Rather than employing photometric taps to calibrate fluctuating coupling efficiency, we are using an "asymmetric" coupler which allows this calibration to be done without losing photons. The Single-Mode Asymmetric Recombination Technique (SMART) experiment has finished lab-testing, and has been installed at IOTA for full commissioning in Summer 2002. We report the results of lab characterization and first sky tests, as well as first fringes on a star using a visible-wavelength single-mode coupler. With both lab and sky experience using unpolarized light, we have found that circular silica fibers are quite practical for precision interferometric measurements. We conclude that circular fibers (as opposed to polarization maintaining fibers) have an undeserved poor reputation and that birefringence effects pose no significant difficulty.
Original languageUndefined/Unknown
Title of host publicationInterferometry for Optical Astronomy II
EditorsW.~A. Traub
Pages1127-1138
Number of pages12
Volume4838
DOIs
Publication statusPublished - 21 Feb 2003

Publication series

NameSociety of Photo-Optical Instrumentation Engineers (SPIE) Conference Series

Cite this

Monnier, J. D., Berger, J-P., Millan-Gabet, R., Traub, W. A., Carleton, N. P., Pedretti, E., Coldwell, C. M., & Papaliolios, C. D. (2003). SMART precision interferometry at 794 nm. In W. A. Traub (Ed.), Interferometry for Optical Astronomy II (Vol. 4838, pp. 1127-1138). (Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series). https://doi.org/10.1117/12.459696