Simultaneous diffraction and resistance measurements of metal sulphides

Anthony V. Powell, T. Erinc Engin, Paz Vaqueiro, Steve Hull

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

We describe the construction of a cell that enables the electrical resistance of a material to be measured simultaneously with the collection of powder neutron diffraction data at elevated temperatures. The cell has been used to investigate the origin of the anomalous electron-transport properties of the monosulphide, CrS. The data reveal that a decrease in electrical resistance above 573 K is associated with the disappearance of semiconducting monoclinic CrS and the concomitant growth of a disordered CdI2-type metallic phase. © 2007 Elsevier Ltd. All rights reserved.

Original languageEnglish
Pages (from-to)1052-1056
Number of pages5
JournalJournal of Physics and Chemistry of Solids
Volume68
Issue number5-6
DOIs
Publication statusPublished - May 2007

Keywords

  • A. Chalcogenides
  • A. Inorganic compounds
  • C. Neutron scattering
  • D. Transport properties

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