Abstract
We describe the construction of a cell that enables the electrical resistance of a material to be measured simultaneously with the collection of powder neutron diffraction data at elevated temperatures. The cell has been used to investigate the origin of the anomalous electron-transport properties of the monosulphide, CrS. The data reveal that a decrease in electrical resistance above 573 K is associated with the disappearance of semiconducting monoclinic CrS and the concomitant growth of a disordered CdI2-type metallic phase. © 2007 Elsevier Ltd. All rights reserved.
Original language | English |
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Pages (from-to) | 1052-1056 |
Number of pages | 5 |
Journal | Journal of Physics and Chemistry of Solids |
Volume | 68 |
Issue number | 5-6 |
DOIs | |
Publication status | Published - May 2007 |
Keywords
- A. Chalcogenides
- A. Inorganic compounds
- C. Neutron scattering
- D. Transport properties