Simulation and Analysis of Dynamic Regimes Involving Ground and Excited State Transitions in Quantum Dot Passively Mode-Locked Lasers

Tianhong Xu; Mattia Rossetti; Paolo Bardella; Ivo Montrosset; S. Breuer; M. Rossetti; W. Elsasser; L. Drzewietzki; P. Bardella; I. Montrosset; M. Krakowski; M. Hopkinson; S. Breuer; M. Rossetti; L. Drzewietzki; P. Bardella; I. Montrosset; W. Elsasser; D. B. Malins; A. Gomez-Iglesias; S. J. White; W. Sibbett; A. Miller; E. U. Rafailov

doi:10.1109/JQE.2012.2211971

Simulation and Analysis of Dynamic Regimes Involving Ground and Excited State Transitions in Quantum Dot Passively Mode-Locked Lasers

Tianhong Xu
, Mattia Rossetti
, Paolo Bardella
, Ivo Montrosset
, S. Breuer
, M. Rossetti
, W. Elsasser
, L. Drzewietzki
, P. Bardella
, I. Montrosset
, M. Krakowski
, M. Hopkinson
, S. Breuer
, M. Rossetti
, L. Drzewietzki
, P. Bardella
, I. Montrosset
, W. Elsasser
, D. B. Malins
, A. Gomez-Iglesias

S. J. White, W. Sibbett, A. Miller, E. U. Rafailov

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1367-1367
Number of pages	1
Journal	IEEE Journal of Quantum Electronics
Volume	48
Issue number	10
DOIs	https://doi.org/10.1109/JQE.2012.2211971
Publication status	Published - Oct 2012

Access to Document

10.1109/JQE.2012.2211971

Cite this

Xu, T., Rossetti, M., Bardella, P., Montrosset, I., Breuer, S., Rossetti, M., Elsasser, W., Drzewietzki, L., Bardella, P., Montrosset, I., Krakowski, M., Hopkinson, M., Breuer, S., Rossetti, M., Drzewietzki, L., Bardella, P., Montrosset, I., Elsasser, W., Malins, D. B., ... Rafailov, E. U. (2012). Simulation and Analysis of Dynamic Regimes Involving Ground and Excited State Transitions in Quantum Dot Passively Mode-Locked Lasers. IEEE Journal of Quantum Electronics, 48(10), 1367-1367. https://doi.org/10.1109/JQE.2012.2211971

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title = "Simulation and Analysis of Dynamic Regimes Involving Ground and Excited State Transitions in Quantum Dot Passively Mode-Locked Lasers",

author = "Tianhong Xu and Mattia Rossetti and Paolo Bardella and Ivo Montrosset and S. Breuer and M. Rossetti and W. Elsasser and L. Drzewietzki and P. Bardella and I. Montrosset and M. Krakowski and M. Hopkinson and S. Breuer and M. Rossetti and L. Drzewietzki and P. Bardella and I. Montrosset and W. Elsasser and Malins, \{D. B.\} and A. Gomez-Iglesias and White, \{S. J.\} and W. Sibbett and A. Miller and Rafailov, \{E. U.\}",

year = "2012",

month = oct,

doi = "10.1109/JQE.2012.2211971",

language = "English",

volume = "48",

pages = "1367--1367",

journal = "IEEE Journal of Quantum Electronics",

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Xu, T, Rossetti, M, Bardella, P, Montrosset, I, Breuer, S, Rossetti, M, Elsasser, W, Drzewietzki, L, Bardella, P, Montrosset, I, Krakowski, M, Hopkinson, M, Breuer, S, Rossetti, M, Drzewietzki, L, Bardella, P, Montrosset, I, Elsasser, W, Malins, DB, Gomez-Iglesias, A, White, SJ, Sibbett, W, Miller, A & Rafailov, EU 2012, 'Simulation and Analysis of Dynamic Regimes Involving Ground and Excited State Transitions in Quantum Dot Passively Mode-Locked Lasers', IEEE Journal of Quantum Electronics, vol. 48, no. 10, pp. 1367-1367. https://doi.org/10.1109/JQE.2012.2211971

TY - JOUR

T1 - Simulation and Analysis of Dynamic Regimes Involving Ground and Excited State Transitions in Quantum Dot Passively Mode-Locked Lasers

AU - Xu, Tianhong

AU - Rossetti, Mattia

AU - Bardella, Paolo

AU - Montrosset, Ivo

AU - Breuer, S.

AU - Rossetti, M.

AU - Elsasser, W.

AU - Drzewietzki, L.

AU - Bardella, P.

AU - Montrosset, I.

AU - Krakowski, M.

AU - Hopkinson, M.

AU - Breuer, S.

AU - Rossetti, M.

AU - Drzewietzki, L.

AU - Bardella, P.

AU - Montrosset, I.

AU - Elsasser, W.

AU - Malins, D. B.

AU - Gomez-Iglesias, A.

AU - White, S. J.

AU - Sibbett, W.

AU - Miller, A.

AU - Rafailov, E. U.

PY - 2012/10

Y1 - 2012/10

U2 - 10.1109/JQE.2012.2211971

DO - 10.1109/JQE.2012.2211971

M3 - Article

SN - 0018-9197

VL - 48

SP - 1367

EP - 1367

JO - IEEE Journal of Quantum Electronics

JF - IEEE Journal of Quantum Electronics

IS - 10

ER -