Abstract
Shuttling of electrons in single-molecule transistors with magnetic leads in the presence of an external magnetic field is considered theoretically. For a current of partially spin-polarized electrons a shuttle instability is predicted to occur for a finite interval of external magnetic field strengths. The lower critical magnetic field is determined by the degree of spin polarization and it vanishes as the spin polarization approaches 100%. The feasibility of detecting magnetic shuttling in a C60-based molecular transistor with magnetic (Ni) electrodes is discussed (Pasupathy et al. (2004) [7]).
| Original language | English |
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| Pages (from-to) | 83–87 |
| Number of pages | 5 |
| Journal | Synthetic Metals |
| Volume | 216 |
| Early online date | 10 Dec 2015 |
| DOIs | |
| Publication status | Published - Jun 2016 |