Shewhart Median Scheme with Estimated Process Parameters Using Median Run Length for Smart Manufacturing

Zhi Lin Chong, Wei Lin Teoh, Peh Sang Ng, Wai Chung Yeong, Sin Yin Teh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Abstract

The exclusive reliance on the average run length (ARL) as a control scheme's performance metric has drawn a lot of criticisms in the literature. This is because the form and skewness of the run length distribution changes depending on the amount of the mean shift in any process, making interpretation based only on the ARL potentially inaccurate. Therefore, when the process parameters are estimated (U-Case), we take into account the median run length (MRL) performance metric for the Shewhart median scheme. To demonstrate how to apply the U-Case Shewhart median scheme, we provide an example for smart manufacturing using a dataset related to the forged piston ring manufacturing process.
Original languageEnglish
Title of host publication2024 IEEE Asia-Pacific Conference on Applied Electromagnetics (APACE)
PublisherIEEE
ISBN (Electronic)9798350364163
DOIs
Publication statusPublished - 17 Feb 2025
Event2024 IEEE Asia-Pacific Conference on Applied Electromagnetics - Langkawi, Kedah, Malaysia
Duration: 21 Dec 202423 Dec 2024

Conference

Conference2024 IEEE Asia-Pacific Conference on Applied Electromagnetics
Abbreviated titleAPACE 2024
Country/TerritoryMalaysia
CityLangkawi, Kedah
Period21/12/2423/12/24

Keywords

  • Control scheme
  • Estimated parameter
  • Median run length
  • Median scheme
  • shift size

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