| Original language | English |
|---|---|
| Publication status | Published - 2000 |
| Event | Optical Diagnostics for Industrial Applications, Proc SPIE 4076 (SPIE) - Bellingham, WA, United States Duration: 1 Jan 2000 → … |
Conference
| Conference | Optical Diagnostics for Industrial Applications, Proc SPIE 4076 (SPIE) |
|---|---|
| Country/Territory | United States |
| City | Bellingham, WA |
| Period | 1/01/00 → … |
| Other | N Halliwell (ed) |
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