Original language | English |
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Publication status | Published - 2000 |
Event | Optical Diagnostics for Industrial Applications, Proc SPIE 4076 (SPIE) - Bellingham, WA, United States Duration: 1 Jan 2000 → … |
Conference
Conference | Optical Diagnostics for Industrial Applications, Proc SPIE 4076 (SPIE) |
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Country/Territory | United States |
City | Bellingham, WA |
Period | 1/01/00 → … |
Other | N Halliwell (ed) |