Scanned Mask Imaging Solid State Laser Tool for Cost Effective Flip Chip – Chip Scale Package Manufacture

David T. E. Myles, Munya Ziyenge, Jonathan D Shephard, David Milne

Research output: Contribution to journalArticle

3 Citations (Scopus)
88 Downloads (Pure)
Original languageEnglish
Pages (from-to)106-109
JournalJournal of Laser Micro/Nanoengineering
Volume10
Issue number1
DOIs
Publication statusPublished - Feb 2015

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