Run sum X- control chart with estimated process parameters

Sajal Saha, Michael Boon Chong Khoo, W. L. Teoh, Ming Ha Lee

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The run sum X- control chart is usually investigated under the assumption of known process parameters. In practice, process parameters are rarely known and they need to be estimated from an in-control Phase I dataset. However, different practitioners use different numbers of Phase I samples to estimate the process parameters. As a result, the commonly used performance measure, ie, the average run length becomes a random variable. In this study, we present a run sum X- control chart with estimated process parameters and use the standard deviation of the average run length to evaluate the average of the average run length performance of the run sum X- chart when process parameters are estimated. Based on the standard deviation of the average run length criterion, the number of Phase I samples required by the estimated process parameter-based run sum X- chart to have an average of the average run length performance close to that obtained under the assumption of known process parameters is recommended.

Original languageEnglish
Pages (from-to)1885–1899
Number of pages15
JournalQuality and Reliability Engineering International
Volume33
Issue number8
Early online date17 Apr 2017
DOIs
Publication statusPublished - 28 Nov 2017

Keywords

  • Average of the average run length
  • Average run length
  • Parameter estimation
  • Run sum X chart
  • Standard deviation of the average run length

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Management Science and Operations Research

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