Role of surface microgeometries on electron escape probability and secondary electron yield of metal surfaces

D. Bajek, S. Wackerow, D. A. Zanin, L. Baudin, K. Bogdanowicz, E. Garcia Tabares Valdivieso, S. Calatroni, B. Di Girolamo, M. Sitko, M. Himmerlich, M. Taborelli, P. Chiggiato, A. Abdolvand*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

27 Citations (Scopus)

Abstract

The influence of microgeometries on the Secondary Electron Yield (SEY) of surfaces is investigated. Laser written structures of different aspect ratio (height to width) on a copper surface tuned the SEY of the surface and reduced its value to less than unity. The aspect ratio of microstructures was methodically controlled by varying the laser parameters. The results obtained corroborate a recent theoretical model of SEY reduction as a function of the aspect ratio of microstructures. Nanostructures - which are formed inside the microstructures during the interaction with the laser beam - provided further reduction in SEY comparable to that obtained in the simulation of structures which were coated with an absorptive layer suppressing secondary electron emission.

Original languageEnglish
Article number250
JournalScientific Reports
Volume10
Issue number1
DOIs
Publication statusPublished - 14 Jan 2020

ASJC Scopus subject areas

  • General

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