Reversible surface morphology in shape-memory alloy thin films

M. J. Wu, W. M. Huang, Y. Q. Fu, F. Chollet, Y. Y. Hu, M. Cai

Research output: Contribution to journalArticle

Abstract

Reversible surface morphology can be used for significantly changing many surface properties such as roughness, friction, reflection, surface tension, etc. However, it is not easy to realize atop metals at micron scale around ambient temperature. In this paper, we demonstrate that TiNi and TiNi based (e.g., TiNiCu) shape-memory thin films, which are sputter-deposited atop a silicon wafer, may have different types of thermally-induced reversible surface morphologies. Apart from the well-known surface relief phenomenon, irregular surface trenches may appear in the fully crystallized thin films, but disappear upon heating. On the other hand, in partially crystallized thin films, the crystalline structures (islands) appear in chrysanthemum-shape at high temperature; while at room temperature, the surface morphology within the islands changes to standard martensite striations. Both phenomena are fully repeatable upon thermal cycling. The mechanisms behind these phenomena are investigated. © 2009 American Institute of Physics.

Original languageEnglish
Article number033517
JournalJournal of Applied Physics
Volume105
Issue number3
DOIs
Publication statusPublished - 2009

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shape memory alloys
thin films
striation
martensite
surface properties
ambient temperature
interfacial tension
roughness
friction
wafers
cycles
physics
heating
silicon
room temperature
metals

Cite this

Wu, M. J., Huang, W. M., Fu, Y. Q., Chollet, F., Hu, Y. Y., & Cai, M. (2009). Reversible surface morphology in shape-memory alloy thin films. Journal of Applied Physics, 105(3), [033517]. https://doi.org/10.1063/1.3075773
Wu, M. J. ; Huang, W. M. ; Fu, Y. Q. ; Chollet, F. ; Hu, Y. Y. ; Cai, M. / Reversible surface morphology in shape-memory alloy thin films. In: Journal of Applied Physics. 2009 ; Vol. 105, No. 3.
@article{28aad32029c345f78f0086892f6d1c5a,
title = "Reversible surface morphology in shape-memory alloy thin films",
abstract = "Reversible surface morphology can be used for significantly changing many surface properties such as roughness, friction, reflection, surface tension, etc. However, it is not easy to realize atop metals at micron scale around ambient temperature. In this paper, we demonstrate that TiNi and TiNi based (e.g., TiNiCu) shape-memory thin films, which are sputter-deposited atop a silicon wafer, may have different types of thermally-induced reversible surface morphologies. Apart from the well-known surface relief phenomenon, irregular surface trenches may appear in the fully crystallized thin films, but disappear upon heating. On the other hand, in partially crystallized thin films, the crystalline structures (islands) appear in chrysanthemum-shape at high temperature; while at room temperature, the surface morphology within the islands changes to standard martensite striations. Both phenomena are fully repeatable upon thermal cycling. The mechanisms behind these phenomena are investigated. {\circledC} 2009 American Institute of Physics.",
author = "Wu, {M. J.} and Huang, {W. M.} and Fu, {Y. Q.} and F. Chollet and Hu, {Y. Y.} and M. Cai",
year = "2009",
doi = "10.1063/1.3075773",
language = "English",
volume = "105",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "3",

}

Wu, MJ, Huang, WM, Fu, YQ, Chollet, F, Hu, YY & Cai, M 2009, 'Reversible surface morphology in shape-memory alloy thin films', Journal of Applied Physics, vol. 105, no. 3, 033517. https://doi.org/10.1063/1.3075773

Reversible surface morphology in shape-memory alloy thin films. / Wu, M. J.; Huang, W. M.; Fu, Y. Q.; Chollet, F.; Hu, Y. Y.; Cai, M.

In: Journal of Applied Physics, Vol. 105, No. 3, 033517, 2009.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Reversible surface morphology in shape-memory alloy thin films

AU - Wu, M. J.

AU - Huang, W. M.

AU - Fu, Y. Q.

AU - Chollet, F.

AU - Hu, Y. Y.

AU - Cai, M.

PY - 2009

Y1 - 2009

N2 - Reversible surface morphology can be used for significantly changing many surface properties such as roughness, friction, reflection, surface tension, etc. However, it is not easy to realize atop metals at micron scale around ambient temperature. In this paper, we demonstrate that TiNi and TiNi based (e.g., TiNiCu) shape-memory thin films, which are sputter-deposited atop a silicon wafer, may have different types of thermally-induced reversible surface morphologies. Apart from the well-known surface relief phenomenon, irregular surface trenches may appear in the fully crystallized thin films, but disappear upon heating. On the other hand, in partially crystallized thin films, the crystalline structures (islands) appear in chrysanthemum-shape at high temperature; while at room temperature, the surface morphology within the islands changes to standard martensite striations. Both phenomena are fully repeatable upon thermal cycling. The mechanisms behind these phenomena are investigated. © 2009 American Institute of Physics.

AB - Reversible surface morphology can be used for significantly changing many surface properties such as roughness, friction, reflection, surface tension, etc. However, it is not easy to realize atop metals at micron scale around ambient temperature. In this paper, we demonstrate that TiNi and TiNi based (e.g., TiNiCu) shape-memory thin films, which are sputter-deposited atop a silicon wafer, may have different types of thermally-induced reversible surface morphologies. Apart from the well-known surface relief phenomenon, irregular surface trenches may appear in the fully crystallized thin films, but disappear upon heating. On the other hand, in partially crystallized thin films, the crystalline structures (islands) appear in chrysanthemum-shape at high temperature; while at room temperature, the surface morphology within the islands changes to standard martensite striations. Both phenomena are fully repeatable upon thermal cycling. The mechanisms behind these phenomena are investigated. © 2009 American Institute of Physics.

UR - http://www.scopus.com/inward/record.url?scp=60449117933&partnerID=8YFLogxK

U2 - 10.1063/1.3075773

DO - 10.1063/1.3075773

M3 - Article

VL - 105

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 3

M1 - 033517

ER -