Abstract
An experiment is described to measure directly the mean free lifetime of the photoexcited carriers in a semi-insulating crystal by monitoring its photoconductivity.
Original language | English |
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Pages (from-to) | 765-768 |
Number of pages | 4 |
Journal | Applied Physics Letters |
Volume | 31 |
Issue number | 11 |
DOIs | |
Publication status | Published - 1977 |