Refractive optical nonlinearities in a thin film ZnSe interference filter

J. Bolger, A. K. Kar, B. S. Wherrett

Research output: Contribution to journalArticle

Abstract

Picosecond angularly-resolved excite-probe measurements have been used to make the first identification of a negative refractive optoelectronic nonlinearity in the ZnSe material deposited in thin-film nonlinear interference filters. A positive thermal refractive nonlinearity becomes dominant within 6 ps. We attribute the ultrafast relaxation of the photoexcited carriers to surface recombination at grain boundaries within the material. © 1992.

Original languageEnglish
Pages (from-to)71-74
Number of pages4
JournalOptical Materials
Volume1
Issue number2
Publication statusPublished - Apr 1992

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