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Recovering object information by holographic speckle imaging technique

  • Wendi Jia*
  • , Jianlin Nie
  • , Steen G. Hanson
  • , Mitsuo Takeda
  • , Wei Wang
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Abstract

In optical imaging systems, speckle acts as a type of noise that significantly degrades image quality. However, it is noteworthy that these speckle patterns contain abundant information about the physical properties of the object's surface, which can be utilized for the identification and detection of concealed targets. This paper will conduct an in-depth study on speckle noise in optical imaging. We propose speckle interference measurement to eliminate speckle noise to reconstruct the amplitude and phase information of the target object. We accomplish this by placing a reference point target next to the object and use interference measurements to eliminate speckle noise to reconstruct feature information of the target object. We used this method to process images and perform simulation analysis. The results show that this method can reconstruct important information from the speckled images, thereby verifying the feasibility of the method.

Original languageEnglish
Title of host publicationSeventeenth International Conference on Correlation Optics
EditorsOleg V. Angelsky, Claudia Y. Zenkova
PublisherSPIE
ISBN (Electronic)9781510695207
ISBN (Print)9781510695191
DOIs
Publication statusPublished - 10 Nov 2025
Event17th International Conference on Correlation Optics 2025 - Chernivtsi, Ukraine
Duration: 8 Sept 202512 Sept 2025

Publication series

NameProceedings of SPIE
Volume13813
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference17th International Conference on Correlation Optics 2025
Country/TerritoryUkraine
CityChernivtsi
Period8/09/2512/09/25

Keywords

  • holographic
  • image processing
  • Image recovery
  • speckle noise

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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