Re-Evaluating the SPRT Chart with Estimated Process Parameters When the Underlying Distributions Are Gamma, Lognormal, and Weibull

Jing Wei Teoh, Wei Lin Teoh*, Zhi Lin Chong, Ming Ha Lee, Sin Yin Teh

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)
40 Downloads (Pure)

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