Abstract
Hong–Ou–Mandel (HOM) interference—the bunching of indistinguishable photons at a beamsplitter—is a staple of quantum optics and lies at the heart of many quantum sensing approaches and recent optical quantum computers. Here we report a full-field, scan-free quantum imaging technique that exploits HOM interference to reconstruct the surface depth profile of transparent samples. We demonstrate the ability to retrieve images with micrometre-scale depth features with photon flux as small as seven photon pairs per frame. Using a single-photon avalanche diode camera, we measure both bunched and anti-bunched photon-pair distributions at the output of an HOM interferometer, which are combined to provide a lower-noise image of the sample. This approach demonstrates the possibility of HOM microscopy as a tool for the label-free imaging of transparent samples in the very low photon regime.
| Original language | English |
|---|---|
| Pages (from-to) | 384-389 |
| Number of pages | 6 |
| Journal | Nature Photonics |
| Volume | 16 |
| Issue number | 5 |
| Early online date | 11 Apr 2022 |
| DOIs | |
| Publication status | Published - May 2022 |
Keywords
- quant-ph
- physics.optics
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics