Quantum microscopy based on Hong-Ou-Mandel interference

Bienvenu Ndagano, Hugo Defienne, Dominic Branford, Yash D. Shah, Ashley Lyons, Niclas Westerberg, Erik M. Gauger, Daniele Faccio

Research output: Contribution to journalArticlepeer-review

Abstract

Hong–Ou–Mandel (HOM) interference—the bunching of indistinguishable photons at a beamsplitter—is a staple of quantum optics and lies at the heart of many quantum sensing approaches and recent optical quantum computers. Here we report a full-field, scan-free quantum imaging technique that exploits HOM interference to reconstruct the surface depth profile of transparent samples. We demonstrate the ability to retrieve images with micrometre-scale depth features with photon flux as small as seven photon pairs per frame. Using a single-photon avalanche diode camera, we measure both bunched and anti-bunched photon-pair distributions at the output of an HOM interferometer, which are combined to provide a lower-noise image of the sample. This approach demonstrates the possibility of HOM microscopy as a tool for the label-free imaging of transparent samples in the very low photon regime.

Original languageEnglish
Pages (from-to)384-389
Number of pages6
JournalNature Photonics
Volume16
Issue number5
Early online date11 Apr 2022
DOIs
Publication statusPublished - May 2022

Keywords

  • quant-ph
  • physics.optics

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

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