Quantum dot thermal imaging of on-chip laser excited microfluidics

D. Choudhury; D. Jaque; A. Rodenas; W. T. Ramsay; L. Paterson; A. K. Kar

Quantum dot thermal imaging of on-chip laser excited microfluidics

D. Choudhury^*, D. Jaque, A. Rodenas, W. T. Ramsay, L. Paterson, A. K. Kar

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Spectral dependence of optically induced thermal effects within optofluidic devices has been analysed using Quantum Dot thermometry. Temperature increment of 10 degrees C is observed which rises to 20 degrees C in the presence of absorbing particles.

Original language	English
Title of host publication	2012 Conference on Lasers and Electro-Optics
Publisher	IEEE
Number of pages	2
ISBN (Print)	978-1-4673-1839-6
Publication status	Published - 2012
Event	2012 Conference on Lasers and Electro-Optics - San Jose, United States Duration: 6 May 2012 → 11 May 2012

Conference

Conference	2012 Conference on Lasers and Electro-Optics
Abbreviated title	CLEO 2012
Country/Territory	United States
City	San Jose
Period	6/05/12 → 11/05/12

Keywords

CELLS

Cite this

@inproceedings{1ad04a1b46094529b444040445fa60db,

title = "Quantum dot thermal imaging of on-chip laser excited microfluidics",

abstract = "Spectral dependence of optically induced thermal effects within optofluidic devices has been analysed using Quantum Dot thermometry. Temperature increment of 10 degrees C is observed which rises to 20 degrees C in the presence of absorbing particles.",

keywords = "CELLS",

author = "D. Choudhury and D. Jaque and A. Rodenas and Ramsay, \{W. T.\} and L. Paterson and Kar, \{A. K.\}",

note = "INSPEC Accession Number: 13060637; 2012 Conference on Lasers and Electro-Optics, CLEO 2012 ; Conference date: 06-05-2012 Through 11-05-2012",

year = "2012",

language = "English",

isbn = "978-1-4673-1839-6",

booktitle = "2012 Conference on Lasers and Electro-Optics",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - Quantum dot thermal imaging of on-chip laser excited microfluidics

AU - Choudhury, D.

AU - Jaque, D.

AU - Rodenas, A.

AU - Ramsay, W. T.

AU - Paterson, L.

AU - Kar, A. K.

N1 - INSPEC Accession Number: 13060637

PY - 2012

Y1 - 2012

N2 - Spectral dependence of optically induced thermal effects within optofluidic devices has been analysed using Quantum Dot thermometry. Temperature increment of 10 degrees C is observed which rises to 20 degrees C in the presence of absorbing particles.

AB - Spectral dependence of optically induced thermal effects within optofluidic devices has been analysed using Quantum Dot thermometry. Temperature increment of 10 degrees C is observed which rises to 20 degrees C in the presence of absorbing particles.

KW - CELLS

M3 - Conference contribution

SN - 978-1-4673-1839-6

BT - 2012 Conference on Lasers and Electro-Optics

PB - IEEE

T2 - 2012 Conference on Lasers and Electro-Optics

Y2 - 6 May 2012 through 11 May 2012

ER -

Quantum dot thermal imaging of on-chip laser excited microfluidics

Abstract

Conference

Keywords

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