Quantum dot thermal imaging of on-chip laser excited microfluidics

D. Choudhury, D. Jaque, A. Rodenas, W. T. Ramsay, L. Paterson, A. K. Kar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Spectral dependence of optically induced thermal effects within optofluidic devices has been analysed using Quantum Dot thermometry. Temperature increment of 10 degrees C is observed which rises to 20 degrees C in the presence of absorbing particles.

Original languageEnglish
Title of host publication2012 Conference on Lasers and Electro-Optics
PublisherIEEE
Number of pages2
ISBN (Print)978-1-4673-1839-6
Publication statusPublished - 2012
Event2012 Conference on Lasers and Electro-Optics - San Jose, United States
Duration: 6 May 201211 May 2012

Conference

Conference2012 Conference on Lasers and Electro-Optics
Abbreviated titleCLEO 2012
CountryUnited States
CitySan Jose
Period6/05/1211/05/12

Keywords

  • CELLS

Cite this

Choudhury, D., Jaque, D., Rodenas, A., Ramsay, W. T., Paterson, L., & Kar, A. K. (2012). Quantum dot thermal imaging of on-chip laser excited microfluidics. In 2012 Conference on Lasers and Electro-Optics IEEE.