Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Xiao Dong; Euan Ramsay; Derryck T. Reid; Bernd Offenbeck; Jan Sundermeyer; Kay Seemann; Norbert Weber

doi:10.1109/CLEOE.2005.1568025

Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Xiao Dong
, Euan Ramsay
, Derryck T. Reid
, Bernd Offenbeck
, Jan Sundermeyer
, Kay Seemann
, Norbert Weber

School of Engineering & Physical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3 µm femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages < IV. © 2005 IEEE.

Original language	English
Title of host publication	2005 Conference on Lasers and Electro-Optics Europe
DOIs	https://doi.org/10.1109/CLEOE.2005.1568025
Publication status	Published - 2005
Event	2005 Conference on Lasers and Elctro-Optics Europe - Munich, Germany Duration: 12 Jun 2005 → 17 Jun 2005

Conference

Conference	2005 Conference on Lasers and Elctro-Optics Europe
Country/Territory	Germany
City	Munich
Period	12/06/05 → 17/06/05

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10.1109/CLEOE.2005.1568025

Cite this

@inproceedings{e06c4caa4ab84c78a09f260b2282ba47,

title = "Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation",

abstract = "We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3 µm femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages < IV. {\textcopyright} 2005 IEEE.",

author = "Xiao Dong and Euan Ramsay and Reid, \{Derryck T.\} and Bernd Offenbeck and Jan Sundermeyer and Kay Seemann and Norbert Weber",

year = "2005",

doi = "10.1109/CLEOE.2005.1568025",

language = "English",

isbn = "0780389743",

booktitle = "2005 Conference on Lasers and Electro-Optics Europe",

note = "2005 Conference on Lasers and Elctro-Optics Europe ; Conference date: 12-06-2005 Through 17-06-2005",

}

Dong, X, Ramsay, E, Reid, DT, Offenbeck, B, Sundermeyer, J, Seemann, K & Weber, N 2005, Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation. in 2005 Conference on Lasers and Electro-Optics Europe. 2005 Conference on Lasers and Elctro-Optics Europe, Munich, Germany, 12/06/05. https://doi.org/10.1109/CLEOE.2005.1568025

TY - GEN

T1 - Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

AU - Dong, Xiao

AU - Ramsay, Euan

AU - Reid, Derryck T.

AU - Offenbeck, Bernd

AU - Sundermeyer, Jan

AU - Seemann, Kay

AU - Weber, Norbert

PY - 2005

Y1 - 2005

N2 - We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3 µm femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages < IV. © 2005 IEEE.

AB - We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3 µm femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages < IV. © 2005 IEEE.

UR - https://www.scopus.com/pages/publications/42749103986

U2 - 10.1109/CLEOE.2005.1568025

DO - 10.1109/CLEOE.2005.1568025

M3 - Conference contribution

SN - 0780389743

SN - 9780780389748

BT - 2005 Conference on Lasers and Electro-Optics Europe

T2 - 2005 Conference on Lasers and Elctro-Optics Europe

Y2 - 12 June 2005 through 17 June 2005

ER -

Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

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